Abstract: In response to the issue of poor detection performance on wafer surface defect spots and elongated scratches, an improved RT-DETR method for wafer surface defect detection is proposed.
Abstract: Affected by the integrated circuit manufacturing process, the output of the power module inside the chip will have a certain degree of deviation. These deviations need to be calibrated ...
More than 1.5 million bags of shredded cheese have been recalled over metal contamination concerns, according to the U.S. Food and Drug Administration. Ohio-based manufacturer Great Lakes Cheese Co.
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