The benefits of AoP radar sensor technology will be apparent in a range of application types, reducing RF design complexity ...
Abstract: In this paper, we present the symmetric BSIM-SOI compact model, specifically designed for Dynamically Depleted Silicon-on-Insulator (DDSOI) MOSFETs, with an emphasis on optimizing their ...
Abstract: Chiplet Electrostatic Discharge (ESD) presents a critical reliability challenge for $2.5 \mathrm{D} / 3 \mathrm{D}$ integration. This paper introduces a methodology to optimize ESD ...