Abstract: This work studies the single-event leakage current (SELC) degradation and the damage mechanism of the 4H-silicon carbide (SiC) p-i-n (PiN) diodes through experiments and simulations.

BAY VILLAGE, Ohio -- Local restaurant and bar owner Dan Deagan and a group of his golfing buddies are opening an indoor golf simulator facility tomorrow (Nov. 7) in the former Bay Lanes bowling alley.

What just happened? It had to finally happen: someone has reported a case of a 12VHPWR connector that melted while connected to an AMD card. This sort of problem is a relatively common occurrence on ...

If you’re looking for the Connections answer for Saturday, July 19, 2025, read on—I’ll share some clues, tips, and strategies, and finally the solutions to all four categories. Along the way, I’ll ...

I'm using the wokwi-photoresistor-sensor module in a simulation with an ESP32 DevKit. I’ve connected the DO pin to GPIO22, and expected it to output HIGH when bright, LOW when dark, based on the ...

[SNIPER] Start [RECORD-TRACE] Using Pin frontend (frontend/pin-frontend) [SNIPER] ----- [SNIPER] Sniper using SIFT/trace-driven frontend [SNIPER] Running full ...